Basma S. Alqadi, Jonathan I. Maletic. Slice-Based Cognitive Complexity Metrics for Defect Prediction. In Kostas Kontogiannis, Foutse Khomh, Alexander Chatzigeorgiou, Marios-Eleftherios Fokaefs, Minghui Zhou, editors, 27th IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2020, London, ON, Canada, February 18-21, 2020. pages 411-422, IEEE, 2020. [doi]
Abstract is missing.