Abdullah Alsharif, Gregory M. Kapfhammer, Phil McMinn. STICCER: Fast and Effective Database Test Suite Reduction Through Merging of Similar Test Cases. In 13th IEEE International Conference on Software Testing, Validation and Verification, ICST 2020, Porto, Portugal, October 24-28, 2020. pages 220-230, IEEE, 2020. [doi]
Abstract is missing.