Josep Altet, André Ivanov, A. Wong. Thermal Testing of Analogue Integrated Circuits: A Case Study. J. Electronic Testing, 19(3):353-357, 2003. [doi]
@article{AltetIW03,
title = {Thermal Testing of Analogue Integrated Circuits: A Case Study},
author = {Josep Altet and André Ivanov and A. Wong},
year = {2003},
doi = {10.1023/A:1023717617973},
url = {http://dx.doi.org/10.1023/A:1023717617973},
tags = {case study, testing},
researchr = {https://researchr.org/publication/AltetIW03},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {19},
number = {3},
pages = {353-357},
}