D. Alvarez, M. J. Abou-Khalil, C. Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, J. Li, C. Seguin, R. Halbach. Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectronics Reliability, 46(9-11):1597-1602, 2006. [doi]
@article{AlvarezARCGKLSH06,
title = {Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant},
author = {D. Alvarez and M. J. Abou-Khalil and C. Russ and Kiran V. Chatty and Robert Gauthier and D. Kontos and J. Li and C. Seguin and R. Halbach},
year = {2006},
doi = {10.1016/j.microrel.2006.07.041},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.041},
tags = {analysis, C++},
researchr = {https://researchr.org/publication/AlvarezARCGKLSH06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
pages = {1597-1602},
}