M. Alvaro, A. Caddemi, G. Crupi, N. Donato. Temperature and bias investigation of self heating effect and threshold voltage shift in pHEMT s. Microelectronics Journal, 36(8):732-736, 2005. [doi]
@article{AlvaroCCD05,
title = {Temperature and bias investigation of self heating effect and threshold voltage shift in pHEMT s},
author = {M. Alvaro and A. Caddemi and G. Crupi and N. Donato},
year = {2005},
doi = {10.1016/j.mejo.2004.11.009},
url = {http://dx.doi.org/10.1016/j.mejo.2004.11.009},
researchr = {https://researchr.org/publication/AlvaroCCD05},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {36},
number = {8},
pages = {732-736},
}