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Improving the testability and reliability of sequential circuits with invariant logic

Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris Bahar. Improving the testability and reliability of sequential circuits with invariant logic. In R. Iris Bahar, Fabrizio Lombardi, David Atienza, Erik Brunvand, editors, Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010. pages 131-134, ACM, 2010. [doi]

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