Nuno Alves, Y. Shi, N. Imbriglia, Jennifer Dworak, Kundan Nepal, R. Iris Bahar. Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 211, IEEE Computer Society, 2011. [doi]
@inproceedings{AlvesSIDNB11,
title = {Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis},
author = {Nuno Alves and Y. Shi and N. Imbriglia and Jennifer Dworak and Kundan Nepal and R. Iris Bahar},
year = {2011},
doi = {10.1109/ETS.2011.59},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2011.59},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/AlvesSIDNB11},
cites = {0},
citedby = {0},
pages = {211},
booktitle = {16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4433-5},
}