Indium Tin Oxide Film Characterization at 0.1-20 GHz Using Coaxial Probe Method

Elias A. Alwan, Asimina Kiourti, John L. Volakis. Indium Tin Oxide Film Characterization at 0.1-20 GHz Using Coaxial Probe Method. IEEE Access, 3:648-652, 2015. [doi]

Abstract

Abstract is missing.