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Empirical Analysis of Fault-Proneness in Methods by Focusing on their Comment Lines

Hirohisa Aman, Sousuke Amasaki, Takashi Sasaki, Minoru Kawahara. Empirical Analysis of Fault-Proneness in Methods by Focusing on their Comment Lines. In Sungdeok (Steve) Cha, Yann-Gaël Guéhéneuc, Gihwon Kwon, editors, 21st Asia-Pacific Software Engineering Conference, APSEC 2014, Jeju, South Korea, December 1-4, 2014. Volume 2: Industry, Short, and QuASoQ Papers. pages 51-56, IEEE, 2014. [doi]

Authors

Hirohisa Aman

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Sousuke Amasaki

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Takashi Sasaki

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Minoru Kawahara

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