Hirohisa Aman, Sousuke Amasaki, Takashi Sasaki, Minoru Kawahara. Empirical Analysis of Fault-Proneness in Methods by Focusing on their Comment Lines. In Sungdeok (Steve) Cha, Yann-Gaël Guéhéneuc, Gihwon Kwon, editors, 21st Asia-Pacific Software Engineering Conference, APSEC 2014, Jeju, South Korea, December 1-4, 2014. Volume 2: Industry, Short, and QuASoQ Papers. pages 51-56, IEEE, 2014. [doi]
@inproceedings{AmanASK14,
title = {Empirical Analysis of Fault-Proneness in Methods by Focusing on their Comment Lines},
author = {Hirohisa Aman and Sousuke Amasaki and Takashi Sasaki and Minoru Kawahara},
year = {2014},
doi = {10.1109/APSEC.2014.93},
url = {http://dx.doi.org/10.1109/APSEC.2014.93},
researchr = {https://researchr.org/publication/AmanASK14},
cites = {0},
citedby = {0},
pages = {51-56},
booktitle = {21st Asia-Pacific Software Engineering Conference, APSEC 2014, Jeju, South Korea, December 1-4, 2014. Volume 2: Industry, Short, and QuASoQ Papers},
editor = {Sungdeok (Steve) Cha and Yann-Gaël Guéhéneuc and Gihwon Kwon},
publisher = {IEEE},
isbn = {978-1-4799-7426-9},
}