Breakdown mechanisms in MgO based magnetic tunnel junctions and correlation with low frequency noise

S. Amara-Dababi, R. C. Sousa, H. Béa, C. Baraduc, K. Mackay, B. Dieny. Breakdown mechanisms in MgO based magnetic tunnel junctions and correlation with low frequency noise. Microelectronics Reliability, 53(9-11):1239-1242, 2013. [doi]

Abstract

Abstract is missing.