Hirotaka Amasuga, Toshihiko Shiga, Masahiro Totsuka, Seiki Goto, Akira Inoue. High Moisture Resistant and Reliable Gate Structure Design in High Power pHEMTs for Millimeter-Wave Applications. IEICE Transactions, 91-C(5):676-682, 2008. [doi]
@article{AmasugaSTGI08,
title = {High Moisture Resistant and Reliable Gate Structure Design in High Power pHEMTs for Millimeter-Wave Applications},
author = {Hirotaka Amasuga and Toshihiko Shiga and Masahiro Totsuka and Seiki Goto and Akira Inoue},
year = {2008},
doi = {10.1093/ietele/e91-c.5.676},
url = {http://dx.doi.org/10.1093/ietele/e91-c.5.676},
tags = {design},
researchr = {https://researchr.org/publication/AmasugaSTGI08},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {91-C},
number = {5},
pages = {676-682},
}