High Moisture Resistant and Reliable Gate Structure Design in High Power pHEMTs for Millimeter-Wave Applications

Hirotaka Amasuga, Toshihiko Shiga, Masahiro Totsuka, Seiki Goto, Akira Inoue. High Moisture Resistant and Reliable Gate Structure Design in High Power pHEMTs for Millimeter-Wave Applications. IEICE Transactions, 91-C(5):676-682, 2008. [doi]

Abstract

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