External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Reliability study on technology trends beyond 20nm

Esteve Amat, Antonio Calomarde, Antonio Rubio. Reliability study on technology trends beyond 20nm. In Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013, Gdynia, Poland, June 20-22, 2013. pages 414-418, IEEE, 2013. [doi]

Authors

Esteve Amat

This author has not been identified. Look up 'Esteve Amat' in Google

Antonio Calomarde

This author has not been identified. Look up 'Antonio Calomarde' in Google

Antonio Rubio

This author has not been identified. Look up 'Antonio Rubio' in Google
runs on