Reliability study on technology trends beyond 20nm

Esteve Amat, Antonio Calomarde, Antonio Rubio. Reliability study on technology trends beyond 20nm. In Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013, Gdynia, Poland, June 20-22, 2013. pages 414-418, IEEE, 2013. [doi]

Abstract

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