Matthias Amberg, Marcel Lüthi, Thomas Vetter. Local Regression Based Statistical Model Fitting. In Michael Goesele, Stefan Roth, Arjan Kuijper, Bernt Schiele, Konrad Schindler, editors, Pattern Recognition - 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings. Volume 6376 of Lecture Notes in Computer Science, pages 452-461, Springer, 2010. [doi]
@inproceedings{AmbergLV10,
title = {Local Regression Based Statistical Model Fitting},
author = {Matthias Amberg and Marcel Lüthi and Thomas Vetter},
year = {2010},
doi = {10.1007/978-3-642-15986-2_46},
url = {http://dx.doi.org/10.1007/978-3-642-15986-2_46},
tags = {rule-based},
researchr = {https://researchr.org/publication/AmbergLV10},
cites = {0},
citedby = {0},
pages = {452-461},
booktitle = {Pattern Recognition - 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings},
editor = {Michael Goesele and Stefan Roth and Arjan Kuijper and Bernt Schiele and Konrad Schindler},
volume = {6376},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-15985-5},
}