Matthias Amberg, Marcel Lüthi, Thomas Vetter. Local Regression Based Statistical Model Fitting. In Michael Goesele, Stefan Roth, Arjan Kuijper, Bernt Schiele, Konrad Schindler, editors, Pattern Recognition - 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings. Volume 6376 of Lecture Notes in Computer Science, pages 452-461, Springer, 2010. [doi]
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