S. H. Amer, A. S. Emara, R. Mohie El-Din, M. M. Fouad, A. H. Madian, H. H. Amer, M. B. Abdelhalim, H. H. Draz. Testing current mode two-input logic gates. In IEEE 27th Canadian Conference on Electrical and Computer Engineering, CCECE 2014, Toronto, ON, Canada, May 4-7, 2014. pages 1-6, IEEE, 2014. [doi]
@inproceedings{AmerEEFMAAD14, title = {Testing current mode two-input logic gates}, author = {S. H. Amer and A. S. Emara and R. Mohie El-Din and M. M. Fouad and A. H. Madian and H. H. Amer and M. B. Abdelhalim and H. H. Draz}, year = {2014}, doi = {10.1109/CCECE.2014.6901052}, url = {http://dx.doi.org/10.1109/CCECE.2014.6901052}, researchr = {https://researchr.org/publication/AmerEEFMAAD14}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {IEEE 27th Canadian Conference on Electrical and Computer Engineering, CCECE 2014, Toronto, ON, Canada, May 4-7, 2014}, publisher = {IEEE}, isbn = {978-1-4799-3099-9}, }