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Testing current mode two-input logic gates

S. H. Amer, A. S. Emara, R. Mohie El-Din, M. M. Fouad, A. H. Madian, H. H. Amer, M. B. Abdelhalim, H. H. Draz. Testing current mode two-input logic gates. In IEEE 27th Canadian Conference on Electrical and Computer Engineering, CCECE 2014, Toronto, ON, Canada, May 4-7, 2014. pages 1-6, IEEE, 2014. [doi]

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