Alaaeldin A. Amin, Mohamed Y. Osman, Radwan E. Abdel-Aal, Husni Al-Muhtaseb. New fault models and efficient BIST algorithms for dual-port memories. IEEE Trans. on CAD of Integrated Circuits and Systems, 16(9):987-1000, 1997. [doi]
@article{AminOAA97,
title = {New fault models and efficient BIST algorithms for dual-port memories},
author = {Alaaeldin A. Amin and Mohamed Y. Osman and Radwan E. Abdel-Aal and Husni Al-Muhtaseb},
year = {1997},
doi = {10.1109/43.658567},
url = {http://doi.ieeecomputersociety.org/10.1109/43.658567},
researchr = {https://researchr.org/publication/AminOAA97},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {16},
number = {9},
pages = {987-1000},
}