Mapping Exploit Code on Paste Sites to the MITRE ATT&CK Framework: A Multi-label Transformer Approach

Benjamin Ampel, Tala Vahedi, Sagar Samtani, Hsinchun Chen. Mapping Exploit Code on Paste Sites to the MITRE ATT&CK Framework: A Multi-label Transformer Approach. In IEEE International Conference on Intelligence and Security Informatics, ISI 2023, Charlotte, NC, USA, October 2-3, 2023. pages 1-6, IEEE, 2023. [doi]

Abstract

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