Parameter estimation in the general contourlet pansharpening method using Bayesian inference

Israa Amro, Javier Mateos, Miguel Vega. Parameter estimation in the general contourlet pansharpening method using Bayesian inference. In Proceedings of the 19th European Signal Processing Conference, EUSIPCO 2011, Barcelona, Spain, August 29 - Sept. 2, 2011. pages 1130-1134, IEEE, 2011. [doi]

Abstract

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