Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology - researchr publication related

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Hussam Amrouch, Girish Pahwa, Amol D. Gaidhane, Chetan K. Dabhi, Florian Klemme, Om Prakash, Yogesh Singh Chauhan. Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology. IEEE Trans. on Circuits and Systems, 67-I(9):3127-3137, 2020. [doi]

The following publications are possibly variants of this publication:

Impact of Radiation on Negative Capacitance FinFETGovind Bajpai, Aniket Gupta, Om Prakash, Girish Pahwa, Jörg Henkel, Yogesh S. Chauhan, Hussam Amrouch. irps 2020: 1-5 [doi]

Negative Capacitance Transistor to Address the Fundamental Limitations in Technology Scaling: Processor PerformanceHussam Amrouch, Girish Pahwa, Amol D. Gaidhane, Jörg Henkel, Yogesh Singh Chauhan. access, 6:52754-52765, 2018. [doi]

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