Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper) - researchr publication authors

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Hussam Amrouch, Victor M. van Santen, Javier Diaz-Fortuny, Florian Klemme. Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper). In IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024. pages 1-8, IEEE, 2024. [doi]

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