Deepthi Amuru, Andleeb Zahra, Zia Abbas. Statistical Variation Aware Leakage and Total Power Estimation of 16 nm VLSI Digital Circuits Based on Regression Models. In Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma, editors, VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers. Volume 1066 of Communications in Computer and Information Science, pages 565-578, Springer, 2019. [doi]
@inproceedings{AmuruZA19,
title = {Statistical Variation Aware Leakage and Total Power Estimation of 16 nm VLSI Digital Circuits Based on Regression Models},
author = {Deepthi Amuru and Andleeb Zahra and Zia Abbas},
year = {2019},
doi = {10.1007/978-981-32-9767-8_47},
url = {https://doi.org/10.1007/978-981-32-9767-8_47},
researchr = {https://researchr.org/publication/AmuruZA19},
cites = {0},
citedby = {0},
pages = {565-578},
booktitle = {VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers},
editor = {Anirban Sengupta and Sudeb Dasgupta and Virendra Singh and Rohit Sharma and Santosh Kumar Vishvakarma},
volume = {1066},
series = {Communications in Computer and Information Science},
publisher = {Springer},
isbn = {978-981-32-9767-8},
}