Ting An, Kaikai Liu, Lirida Alves de Barros Naviner. Analytical method for reliability assessment of concurrent checking circuits under multiple faults. In 37th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2014, Opatija, Croatia, May 26-30, 2014. pages 56-59, IEEE, 2014. [doi]
Abstract is missing.