Xin An, Jinghong Li, Shuo Xu, Liang Chen, Sainan Pi. A Novel Approach for Patent Similarity Measurement Based on Sequence Alignment. In Chengzhi Zhang, Philipp Mayr 0001, Wei Lu, Yi Zhang, editors, Proceedings of the 1st Workshop on Extraction and Evaluation of Knowledge Entities from Scientific Documents co-located with the ACM/IEEE Joint Conference on Digital Libraries in 2020, EEKE@JCDL 2020, Virtual Event, China, August 1st, 2020. Volume 2658 of CEUR Workshop Proceedings, pages 45-49, CEUR-WS.org, 2020. [doi]
Abstract is missing.