Dynamic Risk Measures for Discrete-time Process

Shi An, Jian Sun, Yan Wang. Dynamic Risk Measures for Discrete-time Process. In Yiyu Yao, Zhongzhi Shi, Yingxu Wang, Witold Kinsner, editors, Proceedings of the Firth IEEE International Conference on Cognitive Informatics, ICCI 2006, July 17-19, Beijing, China. pages 815-819, IEEE, 2006. [doi]

Abstract

Abstract is missing.