Aadil Anam, S. Intekhab Amin, Dinesh Prasad. Temperature Sensitivity and Reliability Study of Symmetrical U-Shaped Gate Line TFET: RF/Analog and Linearity Performance Analysis. In IEEE International Symposium on Smart Electronic Systems, iSES 2023, Ahmedabad, India, December 18-20, 2023. pages 99-104, IEEE, 2023. [doi]
Abstract is missing.