Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed Defect Detection Dataset in PCBs

Vinod Kumar Ancha, Fadi N. Sibai, Venkateswarlu Gonuguntla, Ramesh Vaddi. Utilizing YOLO Models for Real-World Scenarios: Assessing Novel Mixed Defect Detection Dataset in PCBs. IEEE Access, 12:100983-100990, 2024. [doi]

Abstract

Abstract is missing.