Philipp Andelfinger, Shuaibing Lu, Chew Wye Chan, Feifei Zhang, Boon-Ping Gan, Jie Zhang 0002, Wentong Cai 0001. Sensitivity Analysis of the SMT2020 Testbed for Risk-Based Maintenance in Semiconductor Manufacturing. In Winter Simulation Conference, WSC 2025, Seattle, WA, USA, December 7-10, 2025. pages 1804-1814, IEEE, 2025. [doi]
Abstract is missing.