Sean B. Andersson, Daniel Y. Abramovitch. A Survey of Non-Raster Scan Methods with Application to Atomic Force Microscopy. In American Control Conference, ACC 2007, New York, NY, USA, 9-13 July, 2007. pages 3516-3521, IEEE, 2007. [doi]
@inproceedings{AnderssonA07,
title = {A Survey of Non-Raster Scan Methods with Application to Atomic Force Microscopy},
author = {Sean B. Andersson and Daniel Y. Abramovitch},
year = {2007},
doi = {10.1109/ACC.2007.4282301},
url = {https://doi.org/10.1109/ACC.2007.4282301},
researchr = {https://researchr.org/publication/AnderssonA07},
cites = {0},
citedby = {0},
pages = {3516-3521},
booktitle = {American Control Conference, ACC 2007, New York, NY, USA, 9-13 July, 2007},
publisher = {IEEE},
}