Marko S. Andjelkovic, Zoran Stamenkovic, Milos Krstic, Rolf Kraemer. Impact of Resistive Open and Bridge Defects on the SET Robustness of Standard CMOS Combinational Logic. In 2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018. pages 1-6, IEEE, 2018. [doi]
Abstract is missing.