Reou Ando, Seiji Sato, Chihiro Uchida, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Masanobu Kanazawa, Kazutaka Sone, Katsushi Namba, Mikihiko Yamamoto. How Does Defect Removal Activity of Developer Vary with Development Experience?. In Haiping Xu, editor, The 27th International Conference on Software Engineering and Knowledge Engineering, SEKE 2015, Wyndham Pittsburgh University Center, Pittsburgh, PA, USA, July 6-8, 2015. pages 540-545, KSI Research Inc. and Knowledge Systems Institute Graduate School, 2015. [doi]
@inproceedings{AndoSUWFIOHKSNY15,
title = {How Does Defect Removal Activity of Developer Vary with Development Experience?},
author = {Reou Ando and Seiji Sato and Chihiro Uchida and Hironori Washizaki and Yoshiaki Fukazawa and Sakae Inoue and Hiroyuki Ono and Yoshiiku Hanai and Masanobu Kanazawa and Kazutaka Sone and Katsushi Namba and Mikihiko Yamamoto},
year = {2015},
doi = {10.18293/SEKE2015-221},
url = {http://dx.doi.org/10.18293/SEKE2015-221},
researchr = {https://researchr.org/publication/AndoSUWFIOHKSNY15},
cites = {0},
citedby = {0},
pages = {540-545},
booktitle = {The 27th International Conference on Software Engineering and Knowledge Engineering, SEKE 2015, Wyndham Pittsburgh University Center, Pittsburgh, PA, USA, July 6-8, 2015},
editor = {Haiping Xu},
publisher = {KSI Research Inc. and Knowledge Systems Institute Graduate School},
isbn = {1-891706-35-7},
}