Reou Ando, Seiji Sato, Chihiro Uchida, Hironori Washizaki, Yoshiaki Fukazawa, Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Masanobu Kanazawa, Kazutaka Sone, Katsushi Namba, Mikihiko Yamamoto. How Does Defect Removal Activity of Developer Vary with Development Experience?. In Haiping Xu, editor, The 27th International Conference on Software Engineering and Knowledge Engineering, SEKE 2015, Wyndham Pittsburgh University Center, Pittsburgh, PA, USA, July 6-8, 2015. pages 540-545, KSI Research Inc. and Knowledge Systems Institute Graduate School, 2015. [doi]
Abstract is missing.