Investigation of Bulk and DTMOS triple-gate devices under 60 MeV proton irradiation - researchr publication authors

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Maria Glória Caño de Andrade, João Antonio Martino, Marc Aoulaiche, Nadine Collaert, Eddy Simoen, Cor Claeys. Investigation of Bulk and DTMOS triple-gate devices under 60 MeV proton irradiation. Microelectronics Reliability, 54(11):2349-2354, 2014. [doi]

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