Modelling and Verification of MOS Transistors at Cryogenic Temperature - researchr publication authors

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Alessandro Andreani, Luca Frontini, Valentino Liberali, Alberto Stabile, Valeria Trabattoni. Modelling and Verification of MOS Transistors at Cryogenic Temperature. In 12th International Conference on Modern Circuits and Systems Technologies, MOCAST 2023, Athens, Greece, June 28-30, 2023. pages 1-4, IEEE, 2023. [doi]

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