Alessandro Andreani, Luca Frontini, Valentino Liberali, Alberto Stabile, Valeria Trabattoni. Modelling and Verification of MOS Transistors at Cryogenic Temperature. In 12th International Conference on Modern Circuits and Systems Technologies, MOCAST 2023, Athens, Greece, June 28-30, 2023. pages 1-4, IEEE, 2023. [doi]
@inproceedings{AndreaniFLST23,
title = {Modelling and Verification of MOS Transistors at Cryogenic Temperature},
author = {Alessandro Andreani and Luca Frontini and Valentino Liberali and Alberto Stabile and Valeria Trabattoni},
year = {2023},
doi = {10.1109/MOCAST57943.2023.10176854},
url = {https://doi.org/10.1109/MOCAST57943.2023.10176854},
researchr = {https://researchr.org/publication/AndreaniFLST23},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {12th International Conference on Modern Circuits and Systems Technologies, MOCAST 2023, Athens, Greece, June 28-30, 2023},
publisher = {IEEE},
isbn = {979-8-3503-2107-4},
}