Paolo Andreini, Simone Bonechi, Alessandro Mecocci, Veronica Lucia Rossi, Giuseppe Ferorelli, Giorgio Chini, Antonio Sanesi. Enhancing Fluorescence Image Analysis through Deep Learning. In IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023, Milano, Italy, October 25-27, 2023. pages 212-217, IEEE, 2023. [doi]
Abstract is missing.