Lachlan L. H. Andrew, Siddharth Barman, Katrina Liggett, Minghong Lin, Adam Meyerson, Alan Roytman, Adam Wierman. A tale of two metrics: simultaneous bounds on competitiveness and regret. In Mor Harchol-Balter, John R. Douceur, Jun Xu, editors, ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS '13, Pittsburgh, PA, USA, June 17-21, 2013. pages 329-330, ACM, 2013. [doi]
Abstract is missing.