C. M. Hicks Andrew, Deborah Ann Furman, Ryan Thomas Rawlins, Michael Edward Gildein, Eitan Farchi. A Novel Double T-wise Approach to Root Cause Analysis via Combinatorial Test Set Completion. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2024 - Workshops, Toronto, ON, Canada, May 27-31, 2024. pages 193-196, IEEE, 2024. [doi]
Abstract is missing.