Fail-Safe Test Generation in Safety Critical Systems

Anneliese Amschler Andrews, Salwa Elakeili, Salah Boukhris. Fail-Safe Test Generation in Safety Critical Systems. In 15th International IEEE Symposium on High-Assurance Systems Engineering, HASE 2014, Miami Beach, FL, USA, January 9-11, 2014. pages 49-56, IEEE Computer Society, 2014. [doi]

Abstract

Abstract is missing.