Random Test Run Length and Effectiveness

James H. Andrews, Alex Groce, Melissa Weston, Ru-Gang Xu. Random Test Run Length and Effectiveness. In 23rd IEEE/ACM International Conference on Automated Software Engineering (ASE 2008), 15-19 September 2008, L Aquila, Italy. pages 19-28, IEEE, 2008. [doi]

Abstract

Abstract is missing.