V. A. Andrienko, Moamar Diaa, V. G. Ryabtsev, T. Yu. Utkina. Architecture of built-in self-test and recovery memory chips. In East-West Design & Test Symposium, EWDTS 2013, Rostov-on-Don, Russia, September 27-30, 2013. pages 1-12, IEEE, 2013. [doi]
Abstract is missing.