Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
D. S. Ang, C. J. Gu, Z. Y. Tung, A. A. Boo, Y. Gao. Evolution of oxide charge trapping under bias temperature stressing. Microelectronics Reliability, 54(4):663-681, 2014. [doi]
Abstract is missing.