Chandra S. Angani, Helena Maria Geirinhas Ramos, Tiago Jorge Rocha, Artur Lopes Ribeiro. SVM classification of thickness and lift-off using transient eddy current oscillation method. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2016, Proceedings, Taipei, Taiwan, May 23-26, 2016. pages 1-6, IEEE, 2016. [doi]
Abstract is missing.