Jan A. Angevare, Youngcheol Chae, Kofi A. A. Makinwa. 2 Resistor-Based Temperature Sensor with a 1-Point Trimmed Inaccuracy of ± 1.3 ° C (3 σ) from -55 ° C to 125 ° C in 65nm CMOS. In IEEE International Solid-State Circuits Conference, ISSCC 2021, San Francisco, CA, USA, February 13-22, 2021. pages 76-78, IEEE, 2021. [doi]
@inproceedings{AngevareCM21,
title = {2 Resistor-Based Temperature Sensor with a 1-Point Trimmed Inaccuracy of ± 1.3 ° C (3 σ) from -55 ° C to 125 ° C in 65nm CMOS},
author = {Jan A. Angevare and Youngcheol Chae and Kofi A. A. Makinwa},
year = {2021},
doi = {10.1109/ISSCC42613.2021.9365995},
url = {https://doi.org/10.1109/ISSCC42613.2021.9365995},
researchr = {https://researchr.org/publication/AngevareCM21},
cites = {0},
citedby = {0},
pages = {76-78},
booktitle = {IEEE International Solid-State Circuits Conference, ISSCC 2021, San Francisco, CA, USA, February 13-22, 2021},
publisher = {IEEE},
isbn = {978-1-7281-9549-0},
}