Multiple Defect Tolerant Devices for Unreliable Future Nanotechnologies

Lorena Anghel, Cristiano Lazzari, Michael Nicolaidis. Multiple Defect Tolerant Devices for Unreliable Future Nanotechnologies. In 7th Latin American Test Workshop, LATW 2006, Buenos Aires, Argentina, March 26-29, 2006. pages 186-191, IEEE, 2006.

Authors

Lorena Anghel

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Cristiano Lazzari

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Michael Nicolaidis

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