Federico Angiolini, M. Haykel Ben Jamaa, David Atienza, Luca Benini, Giovanni De Micheli. Interactive presentation: Improving the fault tolerance of nanometric PLA designs. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 570-575, ACM, 2007. [doi]
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