Ravinithesh Reddy Annapureddy, Arya K. Bhattacharya, Niranjan Reddy M. Adaptive Critic Design for Extreme Learning Machines applied to noisy and drifting industrial processes. In IEEE Symposium Series on Computational Intelligence, SSCI 2018, Bangalore, India, November 18-21, 2018. pages 327-334, IEEE, 2018. [doi]
Abstract is missing.